At present, with advanced manufacturing technologies relentlessly pursuing performance, functionality, and reliability, there is a significant growth trend in high-complexity, high-precision components produced using precision casting, additive manufacturing, and other methods in high-end equipment and major engineering projects. Industrial CT has unique advantages for inspecting complex components, among which CT image segmentation is one of the key steps. Among various segmentation methods, the active contour model has attracted attention due to its excellent edge localization capability and high flexibility, and it can be combined with the level set method to generate sub-pixel closed contours. In this regard, a high-precision segmentation method for industrial CT images based on convex level sets with alternating minimization is proposed. A TV term of the gradient indicator function is introduced into the convex energy functional to enhance weak edge detection capability, and an efficient solution framework is designed based on the augmented Lagrangian method. The proposed model has a global minimum and theoretically extends the optimization framework of traditional level set models. Finally, the point cloud obtained from industrial CT image segmentation was used for measurement evaluation, and existing problems in practice were analyzed and discussed.

Biography of Huang Kuidong

Kuidong Huang, Professor/Doctoral Supervisor at Northwestern Polytechnical University, primarily researches advanced CT technology and equipment, digital inspection and quality evaluation. He has successively led more than 10 national and provincial-level projects, co-published 3 academic monographs, and published over 120 academic papers (over 70 as first/corresponding author), including more than 90 indexed by SCI/EI, holds over 40 granted invention patents, and received the Second Prize of National Defense Technology Invention. He is a member of the Intelligent Imaging Branch of the Chinese Society for Stereology and an editorial board member of CT Theory and Application Research.

Advances in Micro & Nano Resolution X‑ray 3D Computed Tomography

Lu Yanping

Micro&nano resolution computed tomography (CT) technology, with X‑ray digital imaging as its core principle, enables three‑dimensional non‑destructive characterization and quantitative analysis of microstructures at micrometer‑to‑nanometer scales. It serves as a core characterization tool supporting cutting‑edge interdisciplinary research and high‑end equipment development in materials science, life science, advanced manufacturing and other fields, possessing irreplaceable technical advantages in microscale structural analysis and structure‑property correlation research. This paper systematically elaborates the full‑chain technological breakthroughs achieved by the research team in the field of micro&nano resolution CT. Focusing on key directions including high‑performance micro&nano focal X‑ray sources, ultra‑precision air‑bearing rotary stages, high‑precision three‑dimensional image reconstruction and post‑processing algorithm software, complete machine system integration, and multi‑scenario application validation, it details recent technical innovations and R&D progress. Meanwhile, it comprehensively presents the achievements in engineering transformation, industrialization implementation and market application promotion of relevant technical outcomes, providing crucial technical support for the independent controllability and industrial application of micro‑nano resolution CT instruments.

Biography of Lu Yanping

Lu Yanping, Associate Research Fellow of Chongqing University, Deputy Director of the Engineering Research Center of Industrial CT Non-destructive Testing, Ministry of Education. Member of the 6th to 8th National Technical Committee for Non-destructive Testing Standardization, Vice Chairman of the Radiology Committee of the Non-destructive Testing Branch of China Mechanical Engineering Society, Deputy Director of the Industrial CT Qualification Training Center under the Non-destructive Testing Branch of China Mechanical Engineering Society, and Executive Director of Chongqing Non-destructive Testing Society. He has long been engaged in research on industrial CT technology, systems and applications. He has successively presided over 11 national, provincial/ministerial, major horizontal projects and research topics; won 5 provincial/ministerial Science and Technology Progress Awards, obtained 6 authorized invention patents, and served as the chief editor for 3 national standards and co-editor for 9 national standards.